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Ships within 48 hours · Estimated delivery Jul 28 - Aug 2
Estimated Packed Shipping Dimensions: L x W x H = 15” x 14” x 9” @ 2-3 lbs
Removed from a JEOL JWS-2000 Wafer Defect Review SEM Scanning Electron Microscope System
in resalable condition with all original packaging including manuals
Part No: 810-707138-001
The assembly has scuffed
JEOL S20A-1193-0200A/02 Detector PCB Card JVME-AIC JWS-2000 SEM Working Spare Estimated Packed Shipping Dimensions: LJEOL S20A 1193 0200A 02 Detector PCB Card JVME AIC JWS 2000 SEM Working Spare Inventory # CONF 1292 Part No: S20A 1193 0200A 02 Model No: JVME AIC Removed from a JEOL JWS 2000 Wafer Defect Review SEM Scanning Electron Microscope System Made in Japan This JEOL S20A 1193 0200A 02 Detector PCB Card is used working surplus. The physical condition is good, but there are signs of previous use and handling. Sale Details Item Condition: Used Working, 90 Day