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Ships within 48 hours · Estimated delivery Aug 6 - Aug 11
Output: 0-10 VDC
Estimated Packed Shipping Dimensions: L x W x H = 20"x20"x20" @ 17 lbs
Part No: PS/EXQ10P3A
For use with the JEOL JSM-6300/6400F SEM Scanning Electron Microscope System This GW Electronics Type 43 Infrared Chamberscope is used working surplus
Inventory # A-10425
Nikon 300mm Wafer Inspection Stage Chuck NRM-3100 Overlay Measurement Working Output: 0-10 VDCNikon 300mm Wafer Inspection Stage Chuck NRM 3100 Overlay Measurement Working Model No: Inspection Stage Chuck Removed from a Nikon NRM 3100 300mm Wafer Overlay Measurement System This item is working surplus. The physical condition is good, but there are signs of previous use and handling. Sale Details Item Condition: Working, 90 Day Warranty Estimated Packed Shipping Dimensions: L x W x H = 24"x24"x24" @ 25 lbs. Shipping Terms: All Domestic and
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